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Use of Optical Sorting to Detect Karnal Bunt-Infected Wheat Kernels

Published by the American Society of Agricultural and Biological Engineers, St. Joseph, Michigan

Citation:  Paper number  023007,  2002 ASAE Annual Meeting . (doi: 10.13031/2013.9609) @2002
Authors:   Floyd E. Dowell, Theodore N. Boratynski, Ronald E. Ykema, Alan K. Dowdy, Ph.D.
Keywords:   electric eyes, inspection, sampling error

A high-speed sorter was used to remove kernels infected with Karnal bunt from 1800g wheat samples. When the sorter removed about 8% or more of the sample, the reject portion contained 100% of the bunted kernels. Concentrating the bunted kernels in a smaller sample size will reduce sample inspection time and should reduce inspection errors. One high-speed sorter can process up to 8800 kg/hr, thus bunted kernels can be rapidly removed from samples or large lots. The instrument sorted each sample in less than 1 minute. This technology provides the wheat industry with a tool to rapidly inspect samples to aid in regulating Karnal bunt, and to remove bunted grains from seed wheat and wheat destined for food or feed use.

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