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Heat damage is a serious problem frequently associated with wet harvests because of improper storage of damp grain or artificial drying of moist grain at high temperatures. Heat damage causes protein denaturation and reduces processing quality. The current visual method for assessing heat damage is subjective and based on color change. Denatured protein related to heat damage does not always cause a color change in kernels. The objective of this research was to evaluate the use of near-infrared (NIR) reflectance spectroscopy to identify heat-damaged wheat kernels. A diode-array NIR spectrometer was used to collect single kernels spectra and Partial least squares and two-wavelength regression models were used for classification of heat-damaged and undamaged wheat.