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Imaging for the High-Speed Detection of Pest Insects and Other Contaminants in Cereal Grain in Transit

Published by the American Society of Agricultural and Biological Engineers, St. Joseph, Michigan

Citation:  Paper number  013056,  2001 ASAE Annual Meeting. (doi: 10.13031/2013.3530) @2001
Authors:   Christopher Ridgway, Roy Davies, John Chambers
Keywords:   Machine vision, near-infrared, imaging, wheat, grain, contaminants

This paper presents a summary of an extensive programme of research to develop the first automated detector for insects, rodent droppings and ergot in post-harvest grain. The developed system, currently at the laboratory model stage, consists of a high-speed integrated machine vision software package used with a monochrome CCD camera and personal computer. The aim is to deliver a low-cost, high-throughput device for scanning grain in transit. Progress in extending detector capability to include grain weevil larvae hidden inside wheat kernels, by using machine vision with near-infrared imaging, is also presented.

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