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Classification of Cereal Grains Using a Flatbed Scanner

Published by the American Society of Agricultural and Biological Engineers, St. Joseph, Michigan

Citation:  Paper number  036103,  2003 ASAE Annual Meeting . (doi: 10.13031/2013.15408)
Authors:   J. Paliwal, M.S. Borhan, D.S. Jayas
Keywords:   Machine-vision system, cereal grains, flatbed scanner, neural network

In the quest for an inexpensive machine-vision system (MVS) to identify and classify cereal grains, a flatbed scanner was used and its performance was evaluated. Images of bulk samples and individual grain kernels of barley, Canada Western Amber Durum (CWAD) wheat, Canada Western Red Spring (CWRS) wheat, oats, and rye were acquired and classification was done using a four layer back-propagation neural network. Classification accuracies in excess of 99% were obtained using a set of 10 color and textural features for bulk samples. For single kernel images, a set of at least 30 features (morphological, color, and textural) was required to achieve similar classification accuracies. Classification accuracies for single kernel samples varied between 96 and 99%.

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