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X-ray Inspection of Wheat for Granary Weevils. Realtime Digital Imaging vs. Film

Published by the American Society of Agricultural and Biological Engineers, St. Joseph, Michigan

Citation:  Paper number  026093,  2002 ASAE Annual Meeting . (doi: 10.13031/2013.11237) @2002
Authors:   Ron P Haff, David C. Slaughter
Keywords:   X-rays, Wheat, Weevils

A high resolution x-ray imaging system was assembled using a low energy, high current xray source, a low energy x-ray image intensifier, and a CCD camera interfaced to a PC. Overall system resolution was measured at 5 line pairs per millimeter, sufficient for identifying weevil infestations in kernels of wheat. A total of 1672 wheat kernels were imaged, both on film and with the system described above. Of the imaged kernels, 773 revealed infestations ranging from the egg to the adult life stage of the granary weevil, while 899 were non-infested. Both film and digital images were presented to human subjects to compare recognition of the infested kernels. Overall recognition error rates were 11.7% for the images from the intensifier system vs. only 3.0% for the film observations. However, when considering only infestations more advanced than the third larval instar, error rates for both methods fell below 1%.

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