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Soft X-ray Inspection of Wheat Kernels Infested by Sitophilus oryzae

Published by the American Society of Agricultural and Biological Engineers, St. Joseph, Michigan

Citation:  Paper number  023132,  2002 ASAE Annual Meeting . (doi: 10.13031/2013.10369) @2002
Authors:   C. Karunakaran, D.S. Jayas, N.D.G. White
Keywords:   Soft X-ray, infestation detection, Sitophilus oryzae, histogram and textural features, grain kernel sigulation device

The efficiency of a soft X-ray method (65 kV and 15 A) to detect internal seed infestations by the rice weevil, Sitophilus oryzae in Canada Western Red Spring (CWRS) wheat was determined in this study. The infested kernels were identified by the presence of egg plugs and X-rayed every 5 to 7 d until the adults emerged from the kernels. A total of 57 features using histogram groups, histogram and shape moments, and textural features were extracted from the X-ray images. A fourlayer back propagation neural network correctly identified 99% of sound kernels and classed 1% as infested. About 97% of wheat kernels infested by larvae and all kernels infested by pupa and adult stages were correctly identified as infested.

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